Polarization splitting of optical resonant modes in a-Si:H/a-SiO(x):H microcavities.

We present experimental and theoretical results on polarization splitting of optical resonant modes in a-Si:H/a-SiO(x):H microcavities. It is shown experimentally that the splitting sign and value can be controlled by varying the active layer thickness. The polarization splitting achieved in the microcavities is about 8 meV owing to a large optical contrast, which is the ratio of film refractive indices in the distributed Bragg reflectors.